Conductivity of the Crystalline Boron Nanowires Measured in TEM

Keywords:
boron, nanowires, conductivity, TEM

Abstract:
In this experiment we report on using in-situ STM-TEM system and EELS to characterize the electronic properties of the boron nanowires. We use low loss EELS approach to study the band structure and the dielectric response of these nanostructures. The STM-TEM system is used for a contact measurement of the conductivity of the individual Boron nanowire imaged in Transmission Electron Microscope (TEM). The in-situ EELS analysis has been completed with the structural information provided with HRTEM

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Nanotech 2005 Conference Program Abstract