New Developments in Spectroscopic Ellipsometry for Nano Sciences
J.-P. Piel, A. Darragon and C. Defranoux
SOPRA-SA, FR
Keywords:
spectroscopic ellipsometry
Abstract:
Spectroscopic Ellipsometry (SE) is an optical technique, non destructive, to characterize the complex reflectivity of surfaces and layers from the deep UV (190nm) to the mid InfraRed (20µ). SE does not need any reference surface like interferometry nor reference materials or reference beam like in absorption spectroscopy (IRRAS): this is an absolute technique often called first principal technique.
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Nanotech 2005 Conference Program Abstract
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