Optical Characterization of the Au Nanoparticle Monolayer on Silicon Wafer
D-S Wang, L. Chuang and C-W Lin
National Taiwan University, TW
self assembled monolayer, nanoparticle, ellipsometry
In recent years, self-assembly technique has been widely used in fabricating Au nanoparticle layer. It has drawn a lot of attentions owing to its promising application in biosensing.However, to date there have been very few reports on its optical constants, and most of them are the results of multilayers. The study employs multiple-incident-angle ellipsometry to decide the n and k of Au nanoparticle monolayer with high accuracy. The refractive index and extinction coefficient, as expected, vary with the surface coverage of the Au nanoparticle, but slowly attain to constant values, which point, we suppose, is where the surface coverage saturates.
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Nanotech 2005 Conference Program Abstract