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The Application of SRAM Chip as a Novel Neutron Detector

D. Makowski, M. Grecki, B. Mukherjee, S. Simrock, B. Swiercz and A. Napieralski
Technical University of Lodz, Department of Microelectronics and Computer Science, PL

Keywords:
single event effect, single event upset, total ionizing dose, static random access memory, beam loss monitoring system

Abstract:
Bremsstrahlung gamma radiation and photoneutrons are generated during the operation of linear accelerators. These parasitic radiations could pose a risk of radiation damage electronic systems placed in the vicinity of accelerator. One can use different types of detectors to monitoring the neutron and gamma radiation level and deliver prompt warnings, when the radiation exceeds the preset level. Large varieties of available sensors such as, Photo-multipliers, Compton diodes, Ionization chambers, Scintillation counters, Aluminium cathode electron multipliers and PIN diodes are used for the detection of gamma radiation. On the other hand, no neutron detector with a fast response time and interface capability to a computerised radiation monitoring is available. The primary criterion of a neutron detector for a pulsed radiation field produced by a high-energy accelerator, such as the newly installed X-Ray Free-Electron Laser at DESY is the fast response time. The common BF3 chamber based neutron detectors suffer from long response time and pulse pile up effect, therefore could not be used to detect neutrons in real time.

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