Counting and Controlling Point Defects in Carbon Nanotube Electronic Circuits
Y. Fan, N. Emmott and P.G. Collins
University of California, Irvine, US
nanotube defect transistor decoration
As with any disruptive technology in its early stages, nanoelectronics faces major scientific and technological challenges. As initial investigations of carbon nanotube circuits mature, attention can be turned to issues of reliability and reproducibility. This presentation will focus on two recent developments improving carbon nanotube materials for electronics. First, we have developed a wafer-level, electrochemical process which can be used to quantify the defect density of large-area carbon nanotube circuit arrays. Being able to assess and control defects is critical for better process control and device reproducibility. We will demonstrate the role which point defects play in both transistor-like behaviors as well as chemical sensor responses. Second, we will address the related topic of noise in nanotube circuits, and demonstrate noise mechanisms which, when controlled, can reduce circuit fluctuations by two orders of magnitude.
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Nanotech 2005 Conference Program Abstract