Nano Science and Technology InstituteNano Science and Technology Institute
Nano Science and Technology Institute 2005 NSTI Nanotechnology Conference & Trade Show
Nanotech 2005
Bio Nano 2005
Business & Investment
Nano Impact Workshop
Program
Sessions
Sunday
Monday
Tuesday
Wednesday
Thursday
Index of Authors
Index of Keywords
Keynote Presentations
Confirmed Speakers
Participating Companies
Industry Focus Sessions
Nanotech Expo
Special Symposia
Conferences
Sponsors
Exhibitors
Venue 2005
Organization
Press Room
Subscribe
Site Map
Nanotech 2005 At A Glance
Nanotech Proceedings
Nanotechnology Proceedings
Global Partner
nano tech
Supporting Organizations
Nanotech 2005 Supporting Organization
Media Sponsors
Nanotech 2005 Medias Sponsors
Event Contact
696 San Ramon Valley Blvd., Ste. 423
Danville, CA 94526
Ph: (925) 353-5004
Fx: (925) 886-8461
E-mail:
 
 

Surface Roughness as a Function of the DLC Thickness Coating

M.C. Salvadori, D.R. Martins and M. Cattani
University of Sao Paulo, BR

Keywords:
diamondlike carbon, roughness

Abstract:
In this work we have analyzed the evolution of surfaces roughness coated with DLC. This study explores substrates with initial roughness (rms) between hundreds of nanometers and just few nanometers. We have used three substrates, two of policrystalline diamond films, with roughness about hundreds of nanometers, and one of silicon etched with acid, with roughness about few nanometers. Our intention is to have substrates with three different roughnesses. Each sample was characterized by atomic force microscopy (AFM). The substrates were cut into pieces and each piece was coated with different DLC thicknesses. Finally, the DLC films on the samples were characterized by AFM. The surface roughness shifts as a function of the DLC thickness coating have been obtained. For the substrates with original roughness 393 and 278 nm, the roughness shift increased with the DLC thickness up to a maximum value and then decreased. For the substrate with original roughness around 4 nm, the roughness shift oscillates with no systematic tendency to decrease or increase. These results are interpreted using some of our previous papers and taking into account the dynamic growth of thin films.

Back to Program

Sessions Sunday Monday Tuesday Wednesday Thursday Authors

Nanotech 2005 Conference Program Abstract

 
Gold Sponsors
Nanotech Gold Sponsors
Silver Sponsors
Nanotech Silver Sponsors
Gold Key Sponsors
Nanotech Gold Key Sponsors
Nanotech Ventures Sponsors
Nanotech Ventures Sponsors
Sponsors
Nanotech Sponsors
News Headlines
NSTI Online Community
 
 

© Nano Science and Technology Institute, all rights reserved.
Terms of use | Privacy policy | Contact