Modeling FET Variation Within a Chip as a Function of Circuit Design and Layout Choices
J. Watts, N. Lu, C. Bittner, S. Grundon and J. Oppold
IBM, US
Keywords:
FET variation modeling, circuit design, layout choices, compact modeling
Abstract:
In addition to the overall range of circuit characteristics expected from process variation the circuit designer needs to know how closely different circuit element will track one another. We describe a new methodology for modeling correlation between the chip mean variation different design FET and between different FET instances on a single chip. In addition it enables modeling the impact of circuit design choices on FET and circuit tracking.
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Nanotech 2005 Conference Program Abstract
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