| CLEVELAND--(BUSINESS WIRE)--May 6, 2005--Keithley Instruments,
Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs,
announces that it will participate as a silver sponsor at the NanoTech
2005 Conference, which will be held May 9 through 10 at the Anaheim
Marriott & Convention Center in Anaheim, California. Additionally,
Keithley will present three tutorial seminars during the conference,
with two sessions focusing on making electrical measurements on
nanoscale devices and a third on compact model verification. For
further information on Nanotech 2005 and Keithley's participation at
this premier industry event, please visit
http://www.keithley.com/events/tradeshows/nano2005usa.
A Nanoscale Devices Lunch-and-Learn seminar will be co-presented
on Monday, May 9, from 12 noon to 1:30 p.m. PT. Jonathan Tucker, lead
industry consultant at Keithley, will offer insight into electrical
measurements required for nanotechnology and will discuss sources of
measurement uncertainty that affect such sensitive measurements.
Taylor Cavanah, a physicist at Zyvex Corporation, will discuss the
advantages of probing individual transistors that are in-die. Please
visit http://www.keithley.com/promo/sr/022.html for further
information and to register for this event.
James Niemann, senior staff engineer at Keithley, will provide
nanotechnologists with insight into low-level electrical measurements
required for nanotechnology in his seminar, "Applying Electrical
Measurement Techniques for Nanoscale Devices Using Semiconductor
Characterization Systems." This seminar is part of the Nanoscale
Characterization Tools Conference Workshop and will be presented on
Monday, May 9, at 1:30 p.m. PT in Salon J-K of the Anaheim Marriott.
"Measurement Requirements for Robust Compact Models" will be
presented by Carl Scharrer, Keithley's principle industry consultant.
Attendees will learn how to successfully apply accurate, robust, and
traceable measurement technology to the compact models being developed
for scaling mainstream MOS technology into the nanometer environment.
This Compact Modeling Lunch-and-Learn event will be held on Wednesday,
May 11, from 12 noon to 1:30 p.m. PT. Visit
http://www.keithley.com/promo/sr/023.html for more information and to
register.
Keithley has strengthened its test and measurement offering to the
nanotechnology industry with several introductions during the past few
years that offer highly sensitive instruments that are optimized for
measuring the extremely small electrical signals associated with
nanotech devices and materials. These instruments, which include the
Model 4200 Characterization System and the new Models 6221/2182A AC/DC
Current Source/Nanovoltmeter combination, will be featured in the
Keithley exhibit, booth #407, at Nanotech 2005. Additionally, Keithley
is partnering with Zyvex Corporation to offer complete solutions for
Nanomanipulation/Electrical Characterization.
For More Information. For more information and a brochure on
Keithley's measurement solutions for nanoscale device and materials
characterization, please contact the company at:
Telephone: 800-688-9951
440-248-0400
FAX: 440-248-6168
E-mail: product_info@keithley.com
Internet: www.keithley.com
Address: Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891
About Keithley. With more than 50 years of measurement expertise,
Keithley Instruments (http://www.keithley.com) has become a world
leader in advanced electrical test instruments and systems from DC to
RF (radio frequency) geared to the specialized needs of electronics
manufacturers for high performance production testing, process
monitoring, product development, and research. By building upon our
strength in electrical measurement solutions for research, Keithley
has become a production test technology leader for the semiconductor,
wireless, optoelectronics, and other precision electronics segments of
the worldwide electronics industry. The value we provide to our
customers is a combination of precision measurement technology and a
rich understanding of their applications to improve the quality,
throughput, and yield of their products.
Products and company names listed are trademarks or trade names of
their respective companies.
Contact:
Keithley Instruments, Inc.
Ellen Modock, 440-498-2746
modock_ellen@keithley.com
Reader Inquiries: 1-800-688-9951
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