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Keithley, Silver Sponsor of NanoTech 2005, Presents Three Technology Seminars During Conference

Keithley Instruments, a leader in solutions for emerging measurement needs, announces that it will participate as a silver sponsor at the Nanotech 2005 Conference
CLEVELAND--(BUSINESS WIRE)--May 6, 2005--Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces that it will participate as a silver sponsor at the NanoTech2005 Conference, which will be held May 9 through 10 at the AnaheimMarriott & Convention Center in Anaheim, California. Additionally, Keithley will present three tutorial seminars during the conference, with two sessions focusing on making electrical measurements onnanoscale devices and a third on compact model verification. Forfurther information on Nanotech 2005 and Keithley’s participation atthis premier industry event, please visithttp://www.keithley.com/events/tradeshows/nano2005usa.

A Nanoscale Devices Lunch-and-Learn seminar will be co-presentedon Monday, May 9, from 12 noon to 1:30 p.m. PT. Jonathan Tucker, leadindustry consultant at Keithley, will offer insight into electricalmeasurements required for nanotechnology and will discuss sources ofmeasurement uncertainty that affect such sensitive measurements.Taylor Cavanah, a physicist at Zyvex Corporation, will discuss theadvantages of probing individual transistors that are in-die. Pleasevisit http://www.keithley.com/promo/sr/022.html for furtherinformation and to register for this event.

James Niemann, senior staff engineer at Keithley, will providenanotechnologists with insight into low-level electrical measurementsrequired for nanotechnology in his seminar, “Applying ElectricalMeasurement Techniques for Nanoscale Devices Using SemiconductorCharacterization Systems.” This seminar is part of the NanoscaleCharacterization Tools Conference Workshop and will be presented onMonday, May 9, at 1:30 p.m. PT in Salon J-K of the Anaheim Marriott.

“Measurement Requirements for Robust Compact Models” will bepresented by Carl Scharrer, Keithley’s principle industry consultant.Attendees will learn how to successfully apply accurate, robust, andtraceable measurement technology to the compact models being developedfor scaling mainstream MOS technology into the nanometer environment.This Compact Modeling Lunch-and-Learn event will be held on Wednesday, May 11, from 12 noon to 1:30 p.m. PT. Visithttp://www.keithley.com/promo/sr/023.html for more information and toregister.

Keithley has strengthened its test and measurement offering to thenanotechnology industry with several introductions during the past fewyears that offer highly sensitive instruments that are optimized formeasuring the extremely small electrical signals associated withnanotech devices and materials. These instruments, which include theModel 4200 Characterization System and the new Models 6221/2182A AC/DCCurrent Source/Nanovoltmeter combination, will be featured in theKeithley exhibit, booth #407, at Nanotech 2005. Additionally, Keithleyis partnering with Zyvex Corporation to offer complete solutions forNanomanipulation/Electrical Characterization.

For More Information. For more information and a brochure onKeithley’s measurement solutions for nanoscale device and materialscharacterization, please contact the company at:

Telephone:       800-688-9951                 440-248-0400FAX:             440-248-6168E-mail:          product_info@keithley.comInternet:        www.keithley.comAddress:         Keithley Instruments, Inc.                 28775 Aurora Road                 Cleveland, OH 44139-1891

About Keithley. With more than 50 years of measurement expertise, Keithley Instruments (http://www.keithley.com) has become a worldleader in advanced electrical test instruments and systems from DC toRF (radio frequency) geared to the specialized needs of electronicsmanufacturers for high performance production testing, processmonitoring, product development, and research. By building upon ourstrength in electrical measurement solutions for research, Keithleyhas become a production test technology leader for the semiconductor, wireless, optoelectronics, and other precision electronics segments ofthe worldwide electronics industry. The value we provide to ourcustomers is a combination of precision measurement technology and arich understanding of their applications to improve the quality, throughput, and yield of their products.

Products and company names listed are trademarks or trade names oftheir respective companies.

Contact:
Keithley Instruments, Inc.Ellen Modock, 440-498-2746modock_ellen@keithley.comReader Inquiries: 1-800-688-9951
 
Source: http://www.keithley.com/news/corp050605
 
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