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696 San Ramon Valley Blvd., Ste. 423
Danville, CA 94526
Ph: (925) 353-5004
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Carl Zeiss SMT

Booth: 804

The Nano Technology Systems Division of Carl Zeiss SMT offers cutting edge technology electron microscopes and focused ion beam system for failure analysis and device development. The unique LIBRA® energy filtering TEMs with the OMEGA In-column filter enable atomic scale imaging and analysis in one single tool with genuine ease of operation.

The Semiconductor Metrology Systems Division of Carl Zeiss SMT offers leading edge AIMS™ mask inspection systems and MeRiT™ E-beam based mask repair systems for the complete mask defect review and repair cycle.

Web site:

http://www.smt.zeiss.com

 

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