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696 San Ramon Valley Blvd., Ste. 423
Danville, CA 94526
Ph: (925) 353-5004
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Surface Imaging Systems

Booth: 607

For more than 10 years, Surface Imaging Systems has been developing Atomic Force and Scanning Probe Microscopes (AFM/SPM) for the nanotechnology market. Based on our extensive experience, we provide complete solutions for highest resolution surface inspection.

Web site:

http://www.sis-gmbh.com

 

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2011 Nanotechnology Conference and Expo - Nanotech 2011