PSIA manufactures Atomic Force/Scanning Probe Microscopes with a full suite of optional techniques and upgradeable capabilities to facilitate research in nanotechnology. The XE-Series instruments, designed by the pioneers in AFM technology, include closed-loop scanners (all axes) which are essential for nanolithography and manipulation experiments requiring high levels of accuracy and precision. Furthermore, our flexure stage scanner design completely decouples the X/Y and Z axes, making the XE-Series AFMs the most accurate instruments available today. PSIA’s products are well suited for research in all environments. The newly released XE-120 provides scientists with the capability of integrating an inverted optical microscope and its corresponding optical characterization techniques in-line with the XE-platform. User-friendly remote application software is also available to provide open access to all system functions for the ultimate in system control.