Nano Science and Technology InstituteNano Science and Technology Institute
Nano Science and Technology Institute 2004 NSTI Nanotechnology Conference & Trade Show
Nanotech 2004
BioNano 2004
Program
Business & Investment
2004 Sub Sections
Sponsors
Exhibitors
Venue 2004
Proceedings
Organization
Press Room
Purchase CD/Proceedings
NSTI Events
Subscribe
Site Map
 
Nanotech Proceedings
Nanotechnology Proceedings
Supporting Organizations
Nanotech Supporting Organizations
Media Sponsors
Nanotech Media Sponsors
Event Contact
696 San Ramon Valley Blvd., Ste. 423
Danville, CA 94526
Ph: (925) 353-5004
Fx: (925) 886-8461
E-mail:
 
 

PSIA

Booth: 14

PSIA manufactures Atomic Force/Scanning Probe Microscopes with a full suite of optional techniques and upgradeable capabilities to facilitate research in nanotechnology. The XE-Series instruments, designed by the pioneers in AFM technology, include closed-loop scanners (all axes) which are essential for nanolithography and manipulation experiments requiring high levels of accuracy and precision. Furthermore, our flexure stage scanner design completely decouples the X/Y and Z axes, making the XE-Series AFMs the most accurate instruments available today. PSIA’s products are well suited for research in all environments. The newly released XE-120 provides scientists with the capability of integrating an inverted optical microscope and its corresponding optical characterization techniques in-line with the XE-platform. User-friendly remote application software is also available to provide open access to all system functions for the ultimate in system control.

Web site:

http://www.advancedspm.com

 
Sponsors
Nanotech Sponsors
News Headlines
NSTI Online Community
 
 

© Nano Science and Technology Institute, all rights reserved.
Terms of use | Privacy policy | Contact