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Nano Science and Technology Institute 2004 NSTI Nanotechnology Conference & Trade Show
Nanotech 2004
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696 San Ramon Valley Blvd., Ste. 423
Danville, CA 94526
Ph: (925) 353-5004
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Molecular Imaging, Inc.

Booth: 101

The unique combination of characterization and modification of solid surface, with high resolution (Nanometer and sub-nanometer resolution) at all environments (air, solution, and vacuum) makes Atomic Force Microscopy the technique of choice for Nanotechnology.

Molecular Imaging will display the PicoPlus line of Scanning Probe Microscopes (both Atomic Force and Scanning Tunneling microscopes) highlighting our unique options of our systems as related to the Nanotechnology market:

  1. Controlled conditions operation in air and solution: both controlled temperature (heating and cooling) and controlled environment (inert or harsh).
  2. Topography and recognition: We will also introduce new unique AFM technology called TREC, a technique that enables measuring Topography and RECognition in a single scan. Applications for life science, electrochemistry, material science, and nanotechnology will be displayed.
  3. Electrochemical applications: simultaneously imaging and modifying a surface of the nanometer scale under potentiostatic and galvanostatic control.
  4. Closed loop options on the scanner and the stage to allow for reproducible movement around the sample for Nanolithography application.
  5. Automated large stage (PicoMAPS) for handling large samples.
  6. Combination with light inverted microscope (BioScan) for simultaneously gathering light and probe data.

PicoPlus is a Trademark of Molecular Imaging

Web site:

http://www.molec.com/

 
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