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Hitachi High Technologies America

Booth: 402

Hitachi High Technologies America is your nanotechnology resource. In research laboratories and in high-production manufacturing and analysis facilities worldwide, equipment supplied by Hitachi is helping to make tasks easier and products better. Reflecting more than a half-century of experience and the ongoing participation of numerous world-renowned scientists, these systems have become the standard for performance and reliability in a wide range of applications.

These instruments are typically the first choice of those responsible for R&D and quality assurance programs in industries ranging from semiconductors and pharmaceuticals to foods and textiles.

We offer imaging and analysis tools for nanotechnology, research, failure analysis and inspection. Hitachi features a full line of Electron Microscopes, X-ray analysis systems and accessories, Scanning Electron Microscopes (SEM), Transmission Electron Microscopes (TEM), Focused Ion Beam Systems (FIB), Wafer Inspection Tools, Defect Review Tools, Critical Dimension Measurement SEMs (CD-SEM) and E-Beam Lithography Systems.

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