Keithley Instruments, the leader in low level measurements since 1946, provides solutions to the toughest measurement problems, with products that can measure currents from the sub-femtoamp level to tens of amps, voltages less than a nanovolt to thousands of volts, and resistances from nano-ohms to tens of petaohms. Keithley’s measurement tools are engineering to support breakthroughs in emerging technologies.
Today, a growing number of researchers in nanomaterials, nanoelectronics, nano-optoelectronics, and nanobiology depend on Keithley for the sensitive investigative tools and high productivity instruments they need. Keithley instrumentation combines high measurement resolution and sensitivity with low noise and drift characteristics needed to make accurate observations of device or material behavior. Each instrument is engineered to ensure extended reliability and robust performance. Many feature built-in capabilities designed to reduce or eliminate the need for test system programming, allowing multi-disciplinary researchers to spend more time developing and understanding the materials and components of tomorrow.
Keithley’s primary nanotechnology tools, the Model 4200-SCS Semiconductor Characterization System and our ultra-sensitive Model 6430 Sub-Femtoamp Remote SourceMeter(R) are already in use around the world characterizing nanodevices such as carbon nanotubes, molecular electronics, single electron devices, and a variety of nanomaterials. We also offer a variety of cost-effective instruments for research in nanotechnology, including DMMs, picoammeters, SourceMeter instruments, and PC plug-in data acqusition boards.
Keithley Instruments focuses on developing new solutions for several primary markets:
- Electronic Manufacturing Production Test