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Defects and Fault Characterization in Quantum Cellular Automata

M. Baradaran Tahoori, M. Momenzadeh, J. Huang and F. Lombardi
Northeastern University, US

Keywords: quantum computing, nano systems and devices, defect characterization

Abstract:
In this paper, a detailed simulation-based characterization of QCA defects and study of their effects at logic-level are presented. Different defect mechanisms for QCA active devices and interconnects are considered and the appropriate fault models at logic-level are investigated. Different implementations of QCA logic devices and interconnects are compared in term of defect tolerance and testability.

Nanotech 2004 Conference Technical Program Abstract

 
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