Defects and Fault Characterization in Quantum Cellular Automata
M. Baradaran Tahoori, M. Momenzadeh, J. Huang and F. Lombardi
Northeastern University, US
Keywords: quantum computing, nano systems and devices, defect characterization
In this paper, a detailed simulation-based characterization of QCA defects and study of their effects at logic-level are presented. Different defect mechanisms for QCA active devices and interconnects are considered and the appropriate fault models at logic-level are investigated. Different implementations of QCA logic devices and interconnects are compared in term of defect tolerance and testability.
Nanotech 2004 Conference Technical Program Abstract