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Fault Detection and Diagnosis Techniques for Molecular Computing

M.B. Tahoori and S. Mitra
Northeastern University, US

Keywords: molecular electronics, test, diagnosis, BIST, defect-tolerance, fault-tolerance, self-repair

Abstract:
Fault detection and diagnosis techniques that are essential for defect tolerance, fault tolerance and self-repair of molecular computing systems are discussed. These techniques enable robust molecular computing system design protected from manufacturing defects and run-time errors in the underlying hardware.

Nanotech 2004 Conference Technical Program Abstract

 
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