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Nano Science and Technology Institute 2004 NSTI Nanotechnology Conference & Trade Show
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AngstroVision, Inc.

S. Mize
AngstroVision, Inc., US

Keywords: Tools, Instruments

Abstract:
Our mission is to be the leader in providing superior nano-imaging solutions for industrial metrology and characterization, focusing initially on the inspection of silicon devices. The ability to image and measure on a small scale, whether it be the microscale or nanoscale, is fundamental to a broad range of industrial and research applications in information technology, advanced materials and biotechnology. AngstroVision, Inc. has developed a fundamentally new patent-pending technology that for the first time allows the real-time acquisition of high-resolution 3-D video images from the nano-world. The data gathered is metrologically accurate, and can be acquired non-destructively in a wide range of environments without requiring any preparation of samples. The superiority of this new capability versus all other metrology devices gives the Company the opportunity to dominate many application areas and to significantly impact the development of the nanotechnology field overall. The Company has identified and quantified several markets which we can dominate that will collectively reach over $1 billion annually.

Nanotech 2004 Conference Technical Program Abstract

 
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