Nanotech 2003 Exhibitor

Veeco Metrology Group

Web site: www.veeco.com

Veeco Metrology Group features its complete line of Digital Instruments Scanning Probe Microscopes (SPM) for nanoscience, including the NanoMan(tm) System for precision nanomanipulation and high definition nanolithography, and the new PicoForce(tm) MultiMode(tm) advanced force spectroscopy AFM, which allows pN-level measurements. Other featured instruments are Aurora-3 NSOM, and the Dimension, Explorer, and AutoProbe CP-Research(tm) SPMs for surface studies in material science, chemistry, coatings, magnetic media, polymer science, biology, nanolithography, and more.